By Bharat Bhushan, Harald Fuchs
From the reviews:
"Vol. XI comprises contributions approximately contemporary advancements in scanning probe microscopy recommendations. … The editors and their gifted authors were one of the leaders within the research of probe equipment. … every one bankruptcy captures either the thrill and the significance of the paintings and conclusions said, and may make ecocnomic analyzing for researchers in any respect event degrees. … all of the chapters are supported by means of large lists of references and wonderfully illustrated and in colour too, additionally besides graphs, equations etc." (Current Engineering perform, 2009)“The articles … are written in adequate aspect, in order that collage scholars, researchers and engineers can comprehend the physics of the tools, the layout and building of the units and the cantilevers, the sign processing algorithms, and their use in imaging and the outside characterization of the specimens. … SPM encompasses a number of ideas, together with scanning near-field optical microscopy, which has attention-grabbing functions … . well-written and obviously illustrated. … include abundant experimental info and critical dialogue of boundaries and artifacts.” (Barry R. Masters, Optics & Photonics information, September, 2009)
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Extra info for Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques
The simplified principle of the two loop oscillation controller – namely an amplitude stabilization loop and PLL with I/Q demodulation is shown in the block schematic in Fig. 3. This principle of separation in the independent phase/frequency loop and amplitude loop (arrows in Fig. 3) is generally popular in signal processing and is very appropriate for signal processing in SPM. The reason is the physics of interaction in SPM: any frequency change in signal, due to tip–sample interaction, is entirely determined by conservative interaction force and reflected only in the Q channel.
197 26 Nanostructuration and Nanoimaging of Biomolecules for Biosensors Claude Martelet, Nicole Jaffrezic-Renault, Yanxia Hou, Abdelhamid Errachid, François Bessueille . . . . . . . 225 27 Applications of Scanning Electrochemical Microscopy (SECM) Gunther Wittstock, Malte Burchardt, Sascha E. Pust . . . . 259 Nanomechanical Characterization of Structural and Pressure-Sensitive Adhesives Martin Munz, Heinz Sturm . . . . . . . . . . . 301 Development of MOEMS Devices and Their Reliability Issues Bharat Bhushan, Huiwen Liu .
137 5 Scanning Probes for the Life Sciences Andrea M. Ho, Horacio D. Espinosa . . . . . . . . . 183 Self-Sensing Cantilever Sensor for Bioscience Hayato Sone, Sumio Hosaka . . . . . . . . . . . 219 AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication Vinzenz Friedli, Samuel Hoffmann, Johann Michler, Ivo Utke . . 247 6 7 8 Cantilever Spring-Constant Calibration in Atomic Force Microscopy Peter J.